[PDF.04pw] From scientific instrument to industrial machine: Coping with architectural stress in embedded systems (SpringerBriefs in Electrical and Computer Engineering)
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From scientific instrument to industrial machine: Coping with architectural stress in embedded systems (SpringerBriefs in Electrical and Computer Engineering)
[PDF.lq52] From scientific instrument to industrial machine: Coping with architectural stress in embedded systems (SpringerBriefs in Electrical and Computer Engineering)
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| #6628012 in Books | Springer | 2012-05-07 | Original language:English | PDF # 1 | 9.25 x.28 x6.10l,.41 | File type: PDF | 112 pages | ||From the Back Cover||Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In From scientific instrument to industrial machine, we look at the phenomen
Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In From scientific instrument to industrial machine, we look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company. Traditionally, transmission electron microscopes are manually operated scientific instruments, but the...
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